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1 article(s) from Schmied, Roland

Fundamental edge broadening effects during focused electron beam induced nanosynthesis

Roland Schmied,
Jason D. Fowlkes,
Robert Winkler,
Phillip D. Rack and
Harald Plank

Beilstein J. Nanotechnol. 2015, 6, 462–471, doi:10.3762/bjnano.6.47

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Figure 1: (a) Classification of proximal shapes (right hand side). The grey box indicates the intended deposi...

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Figure 2: (a) Radius of the outer halo (AFM-based) of 30 keV PtC deposits as a function of the central pad th...

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Figure 3: Representative AFM height image (a) of a 9 nm thick PtC deposit on Si–SiO₂ fabricated at 25 keV tog...

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Figure 4: AFM height images with overlaid current information of PtC pads deposited on an conductive Au elect...

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Figure 5: (a) Functional classification of proximity deposition based on KFM measurements. (b) and (c) show t...

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Figure 6: Edge-broadening effect for 30 keV deposits of different thickness. (a) shows a normalized height re...

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Figure 7: Broadening effects for 5 keV deposits of different thickness. (b) shows the normalized height repre...

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Figure 8: Outer-halo behavior for increasing pad thicknesses of 5 keV deposits (squares) together with an FSE...

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Figure 9: (a) AFM height cross section of a 20 keV deposit. (b) cumulative BSE emission (blue, left axis) and...

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Full Research Paper

Published 16 Feb 2015

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